UHV Spectroscopy II (410N)

(Kopie 3)

The system combines various methods of electron spectroscopy within an analysis chamber with the ability to carry out procedures in any desired gas atmosphere up to 1000 mbar in a connected preparation chamber. During preparation, the composition of the atmospheres can be continuously determined using a quadrupole mass spectrometer. A subsequent transfer to the analysis chamber is generally possible within just a few minutes. There stoichiometries, valence band structures and adsorbate molecules can be investigated, and chemical depth profiles produced with an ion-etching device, by means of Ar+ sputtering. Conductive, and in many cases also non-conductive samples can be used.


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