Dimension DI-3100

(Kopie 3)

The Veeco Dimension 3100 SPM was originally an atomic force microscope developed for the semi-conductor industry. It is therefore also possible to measure relatively large samples. A sample analysis is carried out under atmospheric conditions and is therefore simple and quick in comparison to measurements taken under a vacuum. In addition, both non vacuum-resistant and also non-conductive sample surfaces can be analysed within the nanometre range.
A compressed air table absorbs mechanical ground vibrations as much as is possible. Oscillations transmitted through the air are not dampened, and therefore the device is not ideally suited for highly accurate measurements. In addition, an optical microscope is integrated for the precise determination of the measuring position.


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