SPECS UHV-XPS/SPM

(Kopie 4)

Using the Specs UHV-XPS/SPM system, samples can be studied both with regard to their chemical composition (XPS), as well with regard to topographic surface properties (STM/AFM). One special feature here is the use of monochromatic X-ray radiation, which is used for the high-resolution chemical analysis of the sample surface. Termpering and sputtering are used as preparatory procedures, among others. The system also has two PVD devices, with which either molecular or metallic layers can be prepared. For XPS and STM studies, both conductive and semi-conductive materials are possible. In addition, the atomic force microscope (AFM) also enables the microscopic examination of non-conductive samples.


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