Keyence VK-X210

(Kopie 3)

The good lateral resolution (approx. 160 nm) enables the accurate mapping of many samples. On the software side, several images can be combined to produce one large image, meaning that even when significantly enlarged, wide areas of the sample can be mapped.
Because the topography of the sample is recorded, it is possible to conduct roughness analyses or profile sections.
Objects with low opacity within the wavelength range of the laser used for detection (408 nm) can be radiated, meaning that even boundary layers or films can be mapped. Due to the various reflectivities with regard to the laser wavelength, material contrasts can be detected in some instances.
A wide field microscopic image is also captured at the same time.




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