JEOL JEM2100

(Kopie 3)

With the JEM 2100, thin sections of solids and nano particles can be directly mapped. With the help of energy-dispersive X-ray analysis, qualitative analysis of element composition can also be performed on particles with a size of up to 70 nm.
In order to characterise different crystalline structures of various materials, diffraction images can be used.
Particles or agglomerates can be represented in three dimensions using tomographic images.


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