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X-ray Photoelectron Spectroscopy (XPS)

(Kopie 2)

X-Ray Photoelectron Spectroscopy (XPS) is based on the external photo effect: By means of the irradiation of X-rays (photon, electrons are emitted from atoms, molecules or solid bodies. As a result of the high energy of the photons, tightly bound core electrons are liberated. The electrons are separated by means of a hemisphere analyser on an energy-selective basis, according to their kinetic energy, and ultimately detected. This energy is element-specific and thus enables qualitative and quantitative statements regarding the composition of a substance or surface. Furthermore, it is possible to layer thicknesses, generally up to 10 nm.

 

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